Scanning Probe Microscopy : Electrical and Electromechanical Phenomena at the Nanoscale
edited by Sergei Kalinin, Alexei Gruverman.
New York, NY : Springer Science+Business Media, LLC, 2007.
v.: digital
ISBN: 9780387286686
Importante! Sobre el catálogo
New York, NY : Springer Science+Business Media, LLC, 2007.
v.: digital
ISBN: 9780387286686