Importante! Sobre el catálogo
| LDR | ·····nmma22·····5u4500 |
| 001 | springer:978-0-387-40090-7 |
| 003 | Springer |
| 005 | 20100326153903.0 |
| 007 | cr nn 008mamaa |
| 008 | 100301s2006\\\\xx\\\\\\\\\j\\\\\\\\eng d |
| 020 | ## | $a 9780387372310 |
| 100 | 1# | $a Foster, Adam. |
| 245 | 10 | $a Scanning Probe Microscopy $h [electronic resource] : $b Atomic Scale Engineering by Forces and Currents / $c by Adam Foster, Werner Hofer. |
| 260 | ## | $a New York, NY : $b Springer Science+Business Media, LLC, $c 2006. |
| 300 | ## | $b v.: digital |
| 440 | #0 | $a NanoScience and Technology, $x 1434-4904 |
| 650 | #0 | $a Chemistry. |
| 650 | #0 | $a Microscopy. |
| 650 | #0 | $a Molecular structure. |
| 650 | #0 | $a Particles (Nuclear physics) |
| 650 | #0 | $a Nanotechnology. |
| 650 | #0 | $a Surfaces (Physics) |
| 650 | 14 | $a Chemistry. |
| 650 | 24 | $a Characterization and Evaluation of Materials. |
| 650 | 24 | $a Nanotechnology. |
| 650 | 24 | $a Surfaces and Interfaces, Thin Films. |
| 650 | 24 | $a Atomic and Molecular Structure and Spectra. |
| 650 | 24 | $a Solid State Physics and Spectroscopy. |
| 650 | 24 | $a Biological Microscopy. |
| 700 | 1# | $a Hofer, Werner. |
| 710 | 2# | $a SpringerLink (Online service) |
| 856 | 40 | $u http://dx.doi.org/10.1007/0-387-37231-8 $y SpringerLink, via BECYT $z Acceso desde instituciones autorizadas |