Applied Scanning Probe Methods III : Characterization
edited by Bharat Bhushan, Harald Fuchs.
Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006.
v.: digital
Serie: NanoScience and Technology, ISSN 1434-4904
ISBN: 9783540269106
Importante! Sobre el catálogo
Berlin, Heidelberg : Springer-Verlag Berlin Heidelberg, 2006.
v.: digital
Serie: NanoScience and Technology, ISSN 1434-4904
ISBN: 9783540269106