Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits : 2nd Edition
edited by Manoj Sachdev, José Pineda de Gyvez.
Boston, MA : Springer, 2007.
v.: digital
Serie: Frontiers in Electronic Testing, ISSN 0929-1296 ; 34
ISBN: 9780387465470
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Boston, MA : Springer, 2007.
v.: digital
Serie: Frontiers in Electronic Testing, ISSN 0929-1296 ; 34
ISBN: 9780387465470